Confocal luminescence investigations of two-beam direct-uv-written silica-on-silicon waveguides
Document Type
Article
Publication Date
1-1-2008
Abstract
Two-beam direct-UV-written silica-on-silicon waveguides have been investigated by confocal micro-luminescence experiments. The spatial and spectral analysis of the visible luminescence observed after 488 nm excitation has revealed the presence of various UV-induced defects due to the different compositions of core and under/over clad layers. The shape and waveguide's dimensions have been estimated from the spatial distribution of defect luminescence generated at the photosensitive core layer. The persistence of the defect luminescence induced in the core layer with increasing temperatures has been used to examine the thermal stability of two-beam UV-written waveguides as well as to determine the recombination energy of the corresponding luminescent defects.
Keywords
Integrated-optics bragg gratings fabrication microscopy preforms fibers glass
Divisions
fac_eng
Publication Title
IEEE Journal of Quantum Electronics
Volume
44
Issue
11-12
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Additional Information
Adikan, Faisal Rafiq Mahamd Gates, James C. Gawith, Corin B. E. Smith, Peter G. R. Jaque, Daniel