Date of Award

1-1-2000

Thesis Type

Undergraduates

Document Type

Thesis

Divisions

Faculty of Computer Science & Information Technology

Department

-

Institution

Universiti Malaya

Abstract

ALU testing mechanism using Boundary Scan technique is a project which is develop to be the tester for testing the digital circuit, integrated circuit and computer chip. The goal of this project is to develop a mechanism and as well building an ALU chip so that we will able to test and determine whether the chips are in a good shape and condition. This project contains two parts: one is lo develop an ALU and second is to develop the boundary scan chip. ALU is a unit or a component for a cligital circuit or a integrated circuit which is develop using VHDL or Very High Speed Integration Circuit (VHS!C) Hardware Description Language. It will be executing arithmetic and logic operations for 8-bits data. Boundary Scan on the other hand is a platform that will test the ALU chip whether is functioning or not. It is also will be develop using VHDL or Very High Speed Integration Circuit (VHS/CJ Hardware Description Language. This project will display or produce a synthesis of a logic circuit. The writer which is Ahmad Zaki Zamani will be developing the ALU and Wan Muhammad Idzuan will be developing the Boundary Scan. In this 105 pages report it will cover all of the aspect of the ALU development from the start till the end of it.

Initial

snms

Additional Information

Academic Exercise (Bachelor’s degree) – Faculty of Computer Science & Information Technology, Universiti Malaya, 2000/2001.

Download

Share

COinS